网络研讨会:用于I/O连接器EMI性能的双混响腔

演示人:Gary Biddle 运用模式调节共振腔确定已知现场水平的技术使EMC社区得以构建国际抗扰性和排放测试标准。IEC 61000-4详细规定了在大型混响腔[LRC]中测试电子设备以证明及预测设备在自由空间环境中的EMI性能。一个相对较新的方法,双混响腔[DRC]具有独特的优势,可确定测试[DUT]中通过无源设备的电磁功率转移。DRC将抗扰性和排放模式调节技术集合起来,评估相邻隔板中安装的DUT。连接器IO产品的测试结果可以用屏蔽效率[ScrEff]术语进行表示。本次演示表明支持模式调节技术和硬件,以及连接器IO测试结果高达40 GHz。

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